Electronic
and communication 2010
1.The
current I in the given network.
a) 1A
b) 3A
c) 5A
d) 7A
a) 1A
b) 3A
c) 5A
d) 7A
2.For
the Delta‐ Wye transformation in given figure, the value of the
resistance R is.
a) 1/3 ohms
b) 2/3 ohms
c) 3/2 ohms
d) 3 ohms
a) 1/3 ohms
b) 2/3 ohms
c) 3/2 ohms
d) 3 ohms
3.In
the given network, the Thevenin’s equivalent as seen by the load resistance Rl
is
a) V=10 V, R= 2ohms
b) V=10V, R=3 ohms
c) V=15V, R= 2ohms
d) V=15V, R=3 ohms
a) V=10 V, R= 2ohms
b) V=10V, R=3 ohms
c) V=15V, R= 2ohms
d) V=15V, R=3 ohms
4.The
current I in a series R‐L circuit with R=10 ohms and
L=20mH is given by i=2sin500t A. If v is the voltage across the R‐L
combination then i
a) lags v by 45 degree
b) is in‐phase with v
c) leads v by 45
d) lags v by 90
a) lags v by 45 degree
b) is in‐phase with v
c) leads v by 45
d) lags v by 90
5.In
thr given network, the mesh current I and the input impedance seen by the 50 V
source, respectively, are
a) 125/13 A and 11/8 ohms
b) 150/13 A and 13/8 ohms
c) 150/13 A and 11/8 ohms
d) 125/13 A and 13/8 ohms
a) 125/13 A and 11/8 ohms
b) 150/13 A and 13/8 ohms
c) 150/13 A and 11/8 ohms
d) 125/13 A and 13/8 ohms
6.A
voltage sourcehaving a source impedance Z = R + jX can deliver maximum Average
power to a load impedance Z, when
a) Z = R + jX
b) Z = R
c) Z = jX
d) Z = R –jX
a) Z = R + jX
b) Z = R
c) Z = jX
d) Z = R –jX
7.In
the given circuit, the switch S is closed at t=0. Assuming that there is no
initial Charge in the capacitor, the current i(t) for t>0 is
a) V/R e^ (‐2t/RC)
b) V/R e^ (‐t/RC)
c) V/2R e^ (‐2t/RC)
d) V/2R e^ (‐t/RC)
a) V/R e^ (‐2t/RC)
b) V/R e^ (‐t/RC)
c) V/2R e^ (‐2t/RC)
d) V/2R e^ (‐t/RC)
8.For
the circuit in given figure, if e(t) is a ramp signal, the steady state value
of the Output voltage v(t) is
a) 0
b) LC
c) R/L
d) RC
a) 0
b) LC
c) R/L
d) RC
9.For
the series RLC circuit in given figure, if w=1000 rad/sec, then the current I
(in Amperes) is
a) 2 ∟‐15
b) 2 ∟15
c) √2∟‐15
d) √2∟15
a) 2 ∟‐15
b) 2 ∟15
c) √2∟‐15
d) √2∟15
10.The
Y‐parameter
matrix (mA/V) of the two‐port given network is
a) [2 ‐1 ‐1 2]
b) [2 1 ‐1 2]
c) [1 ‐2 ‐1 2]
d) [2 1 1 2]
a) [2 ‐1 ‐1 2]
b) [2 1 ‐1 2]
c) [1 ‐2 ‐1 2]
d) [2 1 1 2]
11.The
maximum number of trees of the given graph is
a) 16
b) 25
c) 100
d) 125
a) 16
b) 25
c) 100
d) 125
12.Given
figure shows a graph and one of its trees. Corresponding to the tree, the group
of branches that CAN NOT constitute a fundamental cut set is
a) 1,2,3
b) 1,4,6,8,3
c) 5,6,8,3
d) 4,6,7,3
a) 1,2,3
b) 1,4,6,8,3
c) 5,6,8,3
d) 4,6,7,3
13.The
Y‐parameter
matrix of a network is given by Y=[1 1 ‐1 1] A/V. The Z11 parameter of the
same network is
a) ½ ohms
b) 1/√2 ohms
c) 1 ohms
d) 2 ohms
a) ½ ohms
b) 1/√2 ohms
c) 1 ohms
d) 2 ohms
14.For
the given circuit, the switch was kept closed for a long time before opening it
at t=0. The voltage v(0+) is
a) ‐10 V
b) ‐1 V
c) 0V
d) 10 V
a) ‐10 V
b) ‐1 V
c) 0V
d) 10 V
15.The
input impedance of a series RLC circuit operating at frequency W=√2w, w being
the resonant frequency, is
a) R‐j(wL/√2) ohms
b) R+j(wL/√2) ohms
c) R‐j√2wL ohms
d) R‐j√2wL ohms
a) R‐j(wL/√2) ohms
b) R+j(wL/√2) ohms
c) R‐j√2wL ohms
d) R‐j√2wL ohms
16.The
threshold voltage V is negative for
a) an n‐channel enhancement MOSFET
b) an n‐channel depletion MOSFET
c) an p‐channel depletion MOSFET
d) an p‐channel JFET
a) an n‐channel enhancement MOSFET
b) an n‐channel depletion MOSFET
c) an p‐channel depletion MOSFET
d) an p‐channel JFET
17.At
a given temperature, a semiconductor with intrinsic carrier concentration ni=
10 ^ 16 / m^3 is doped with a donor dopant of concentration Nd = 10 ^ 26 /m^3.
Temperature remaining the same, the hole concentration in the doped
semiconductor is
a) 10 ^ 26 /m^3
b) 10 ^ 16 /m^3
c) 10 ^ 14 /m^3
d) 10 ^ 6 /m^3}
a) 10 ^ 26 /m^3
b) 10 ^ 16 /m^3
c) 10 ^ 14 /m^3
d) 10 ^ 6 /m^3}
18.At
room temperature, the diffusion and drift constants for holes in a P‐type
semiconductor
were measured to be Dp = 10 cm^2/s and µp = 1200 cm^2/V‐s, respectively. If the diffusion constant of electrons in an N‐type semiconductor at the same temperature is Dn = 20 cm^2/s, the drift constant for electrons in it is
a) µn = 2400 cm^2/V‐s
b) µn = 1200 cm^2/V‐s
c) µn = 1000 cm^2/V‐s
d) µn = 600 cm^2/V‐s
were measured to be Dp = 10 cm^2/s and µp = 1200 cm^2/V‐s, respectively. If the diffusion constant of electrons in an N‐type semiconductor at the same temperature is Dn = 20 cm^2/s, the drift constant for electrons in it is
a) µn = 2400 cm^2/V‐s
b) µn = 1200 cm^2/V‐s
c) µn = 1000 cm^2/V‐s
d) µn = 600 cm^2/V‐s
19.A
common LED is made up of
a) intrinsic semiconductor
b) direct semiconductor
c) degenerate semiconductor
d) indirect semiconductor
a) intrinsic semiconductor
b) direct semiconductor
c) degenerate semiconductor
d) indirect semiconductor
20.When
operating as a voltage regulator, the breakdown in a Zener diode occurs due to
the
a) tunneling effect
b) avalanche breakdown
c) impact ionization
d) excess heating of the junction.
a) tunneling effect
b) avalanche breakdown
c) impact ionization
d) excess heating of the junction.